MARCUS SNOWDEN. An Analysis of Fault-Tolerant Dual-Core Lockstep Architectures and Soft Error Mitigation Strategies in High-Reliability Semiconductor Systems. Global Multidisciplinary Journal, [S. l.], v. 3, n. 10, p. 12–17, 2024. Disponível em: https://www.grpublishing.org/journals/index.php/gmj/article/view/376.. Acesso em: 28 mar. 2026.